(alphabetical by last name)
Steven M. Battenfeld, PE
James Binkley, FAIA
Mike Bushue
Daniel J. Carnovale, P.E.
John Consoli
Dennis Cronin
Neil Diener
Dave DiQuinzio
Brian K. Fabel, P.E.
Steve A. Fairfax
Richard Farley, AIA, PE
Brian Fortenbery
James Fulton, PhD
Chris Gardner
Michael Golay, PhD
Johnny Gonzales
Ashley Harkness
Bartosz Ilkowski
John Jackson
Bret W. Lehman, PE
David G. Loucks, P.E.
Jim McDowall
Frank Nemia, PE
Suhas V. Patankar, PhD
Stephen L. Peet
John Ryan
Dr. T.K. Srinivas
David C. Trindade, PhD
William Tschudi
Curt L. Wegener
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| David C, Trindade, PhD |
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David C, Trindade, PhD
Distinguished Engineer
Sun Microsystems, Inc.
SUN Microsystems - Analysis of Field Data for Repairable Systems
[view session info]
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Dr. David Trindade is a Distinguished Engineer (DE) at Sun Microsystems, Inc. His fields of expertise include reliability, statistical analysis, and modeling of components, systems, and software; and applied statistics, especially design of experiments (DOE) and statistical process control (SPC). His previous positions include: Senior Director of Software Quality at Phoenix Technologies; Senior Fellow, Director of Reliability, and Director of Applied Statistics at AMD; Worldwide Director of Quality and Reliability at General Instrument; and Advisory Engineer at IBM. He has taught statistical topics to thousands of engineers in industry and academia worldwide. He has been an adjunct instructor at Santa Clara University and the University of Vermont, teaching graduate level reliability, probability, and DOE. Dr. Trindade has authored many papers and presented at many international conferences. He is co-author (with Dr. Paul Tobias) of the book Applied Reliability, 3nd ed., scheduled for publication in 2007. He has a BS in Physics, an MS in Statistics, an MS in Material Sciences and Semiconductor Physics, and a Ph.D. in Mechanical Engineering and Statistics.
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